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Ultra high step-down converter

Author:
Yau, Y.T. , Hwu, K.I.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/SISPAD.2014.6931590
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1014478
Keyword(s): flash memories,logic design,silicon compounds,technology CAD (electronics),2D write and erase model,DAHE,FN tunneling,SiN,TCAD,flash memory P-channel cell structure,Data models,Films,Logic gates,Optimization,Programming,Silicon compounds,Tunneling,Flash Memory,P-Channel,SONOS,TCAD,Two-Bit
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    Ultra high step-down converter

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contributor authorYau, Y.T. , Hwu, K.I.
date accessioned2020-03-12T20:26:13Z
date available2020-03-12T20:26:13Z
date issued2014
identifier other6869983.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1014478?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleUltra high step-down converter
typeConference Paper
contenttypeMetadata Only
identifier padid8137879
subject keywordsflash memories
subject keywordslogic design
subject keywordssilicon compounds
subject keywordstechnology CAD (electronics)
subject keywords2D write and erase model
subject keywordsDAHE
subject keywordsFN tunneling
subject keywordsSiN
subject keywordsTCAD
subject keywordsflash memory P-channel cell structure
subject keywordsData models
subject keywordsFilms
subject keywordsLogic gates
subject keywordsOptimization
subject keywordsProgramming
subject keywordsSilicon compounds
subject keywordsTunneling
subject keywordsFlash Memory
subject keywordsP-Channel
subject keywordsSONOS
subject keywordsTCAD
subject keywordsTwo-Bit
identifier doi10.1109/SISPAD.2014.6931590
journal titleower Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), 2014 International
filesize1275623
citations0
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