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Signed poisson map for shape analysis

contributor authorGao, A.Yi , Bouix, B.Sylvain
date accessioned2020-03-12T20:23:50Z
date available2020-03-12T20:23:50Z
date issued2014
identifier other6867890.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1013003?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleSigned poisson map for shape analysis
typeConference Paper
contenttypeMetadata Only
identifier padid8135978
subject keywordsX-ray diffraction
subject keywordsorganic semiconductors
subject keywordsorganic-inorganic hybrid materials
subject keywordssemiconductor thin films
subject keywordssolar cells
subject keywordsthin film devices
subject keywordsvapour deposition
subject keywordsCH<
subject keywordssub>
subject keywords3<
subject keywords/sub>
subject keywordsNH<
subject keywordssub>
subject keywords3<
subject keywords/sub>
subject keywordsPbI<
subject keywordssub>
subject keywords3<
subject keywords/sub>
subject keywordsperovskite films
subject keywordsPCBM
subject keywordsPEDOT:PSS
subject keywordsX-ray diffraction data
subject keywordselectron transport layer
subject keywordshigh open-circuit voltage
subject keywordshigh-quality perovskite absorbers
subject keywordshole transport layer
subject keywordsorganic-inorganic hybrid perovskite thin-films
subject keywordsphotovoltaic applications
subject keywordsplanar heterojunctio
identifier doi10.1109/PVSC.2014.6925219
journal titleiomedical Imaging (ISBI), 2014 IEEE 11th International Symposium on
filesize2484326
citations0


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