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Investigation of random telegraph noise amplitudes in hafnium oxide resistive memory devices

date accessioned2020-03-12T20:17:03Z
date available2020-03-12T20:17:03Z
date issued2014
identifier other6861157.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1008788?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleInvestigation of random telegraph noise amplitudes in hafnium oxide resistive memory devices
typeConference Paper
contenttypeMetadata Only
identifier padid8130722
subject keywordsmeta data
subject keywordsmultiprocessing systems
subject keywordsnetwork operating systems
subject keywordsparallel databases
subject keywordsstorage management
subject keywordsLustre parallel distributed file system metadata server
subject keywordsMDS back-end device
subject keywordsXFS
subject keywordsext4
subject keywordsfour socket NUMA platform
subject keywordslocal file systems
subject keywordsmdtest benchmark
subject keywordsmetadata workloads
subject keywordsmultisocket platform
subject keywordsnonuniform memory access
subject keywordsperformance scalability
subject keywordsKernel
subject keywordsLinux
subject keywordsPerformance evaluation
subject keywordsScalability
subject keywordsServers
subject keywordsSockets
identifier doi10.1109/PDSW.2014.5
journal titleeliability Physics Symposium, 2014 IEEE International
filesize361802
citations0
contributor rawauthorChung, Y.T. , Liu, Y.H. , Su, P.C. , Cheng, Y.H. , Tahui Wang , Chen, M.C.


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