Show simple item record

date accessioned2020-03-12T20:16:57Z
date available2020-03-12T20:16:57Z
date issued2014
identifier other6861099.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1008731?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleSiGe composition and thickness effects on NBTI in replacement metal gate / high-κ technologies
typeConference Paper
contenttypeMetadata Only
identifier padid8130655
subject keywordsGPR
subject keywordsNDT
subject keywordsarchaeology
subject keywordsdata interpretation
subject keywordsremote sensing
identifier doi10.1109/ICGPR.2014.6970376
journal titleeliability Physics Symposium, 2014 IEEE International
filesize785632
citations0
contributor rawauthorSrinivasan, P. , Fronheiser, J. , Akarvardar, K. , Kerber, A. , Edge, L.F. , Southwick, R.G. , Cartier, E. , Kothari, H.


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record