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SiGe composition and thickness effects on NBTI in replacement metal gate / high-κ technologies

Author:
Srinivasan, P. , Fronheiser, J. , Akarvardar, K. , Kerber, A. , Edge, L.F. , Southwick, R.G. , Cartier, E. , Kothari, H.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICGPR.2014.6970376
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1008731
Keyword(s): GPR,NDT,archaeology,data interpretation,remote sensing
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    SiGe composition and thickness effects on NBTI in replacement metal gate / high-κ technologies

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date accessioned2020-03-12T20:16:57Z
date available2020-03-12T20:16:57Z
date issued2014
identifier other6861099.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1008731?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleSiGe composition and thickness effects on NBTI in replacement metal gate / high-κ technologies
typeConference Paper
contenttypeMetadata Only
identifier padid8130655
subject keywordsGPR
subject keywordsNDT
subject keywordsarchaeology
subject keywordsdata interpretation
subject keywordsremote sensing
identifier doi10.1109/ICGPR.2014.6970376
journal titleeliability Physics Symposium, 2014 IEEE International
filesize785632
citations0
contributor rawauthorSrinivasan, P. , Fronheiser, J. , Akarvardar, K. , Kerber, A. , Edge, L.F. , Southwick, R.G. , Cartier, E. , Kothari, H.
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