Systematic reliability characterizations on Average Output Voltage (AVO) shift of Display Driver IC by HTOL
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: 2014شناسه الکترونیک: 10.1109/ICLP.2014.6973326
کلیدواژه(گان): Ash,Cameras,Clouds,Corona,Joining processes,Lightning,Radar,attachment process,bolt-from-the-blue,corona,high-speed camera,lightning,space stem
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Systematic reliability characterizations on Average Output Voltage (AVO) shift of Display Driver IC by HTOL
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date accessioned | 2020-03-12T20:16:14Z | |
date available | 2020-03-12T20:16:14Z | |
date issued | 2014 | |
identifier other | 6860618.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1008291 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Systematic reliability characterizations on Average Output Voltage (AVO) shift of Display Driver IC by HTOL | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8130119 | |
subject keywords | Ash | |
subject keywords | Cameras | |
subject keywords | Clouds | |
subject keywords | Corona | |
subject keywords | Joining processes | |
subject keywords | Lightning | |
subject keywords | Radar | |
subject keywords | attachment process | |
subject keywords | bolt-from-the-blue | |
subject keywords | corona | |
subject keywords | high-speed camera | |
subject keywords | lightning | |
subject keywords | space stem | |
identifier doi | 10.1109/ICLP.2014.6973326 | |
journal title | eliability Physics Symposium, 2014 IEEE International | |
filesize | 342307 | |
citations | 0 | |
contributor rawauthor | Jungdong Kim , Donghun Kim , Minhyeok Choe , Kidan Bae , Sangchul Shin , Sangwoo Pae , Jongwoo Park |