Scaling and reliability of NAND flash devices
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Year
: 2014DOI: 10.1109/SoRuCom.2014.35
Keyword(s): Automation,Computers,Mathematics,Operating systems,Program processors,Programming,on-board software,programming languages,software
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Scaling and reliability of NAND flash devices
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| date accessioned | 2020-03-12T20:16:12Z | |
| date available | 2020-03-12T20:16:12Z | |
| date issued | 2014 | |
| identifier other | 6860599.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1008273?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Scaling and reliability of NAND flash devices | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8130098 | |
| subject keywords | Automation | |
| subject keywords | Computers | |
| subject keywords | Mathematics | |
| subject keywords | Operating systems | |
| subject keywords | Program processors | |
| subject keywords | Programming | |
| subject keywords | on-board software | |
| subject keywords | programming languages | |
| subject keywords | software | |
| identifier doi | 10.1109/SoRuCom.2014.35 | |
| journal title | eliability Physics Symposium, 2014 IEEE International | |
| filesize | 460365 | |
| citations | 0 | |
| contributor rawauthor | Youngwoo Park , Jaeduk Lee , Seong Soon Cho , Gyoyoung Jin , Eunseung Jung |