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contributor authorYoung-Joon Park , Jungwoo Joh , Kil-Soo Ko
date accessioned2020-03-12T20:16:11Z
date available2020-03-12T20:16:11Z
date issued2014
identifier other6860583.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1008258?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleElectromigration in strapped metal layers with large dimensions for lateral power device applications
typeConference Paper
contenttypeMetadata Only
identifier padid8130081
subject keywordsEmulation
subject keywordsFoot
subject keywordsPerformance evaluation
subject keywordsProsthetics
subject keywordsRobots
subject keywordsTorque
identifier doi10.1109/ARSO.2014.7020992
journal titleeliability Physics Symposium, 2014 IEEE International
filesize1117227
citations0


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