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LeCTo: A rich lecture capture solution

Author:
Pale, P. , Petrovic, J. , Jeren, B.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/PVSC.2014.6925138
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1007666
Keyword(s): aluminium compounds,anodisation,electrodeposition,elemental semiconductors,ellipsometry,passivation,porosity,porous materials,refractive index,silicon,solar cells,thin films,transmission electron microscopy,Al<,sub>,2<,/sub>,O<,sub>,3<,/sub>,Si,aluminum precursor thickness,anodic aluminium oxide growth rate,antireflection effects,applied voltage effects,barrier layer thickness,crystalline silicon solar cells,electrochemical bath,ellipsometry,light illumina
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    LeCTo: A rich lecture capture solution

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contributor authorPale, P. , Petrovic, J. , Jeren, B.
date accessioned2020-03-12T20:15:15Z
date available2020-03-12T20:15:15Z
date issued2014
identifier other6859699.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1007666?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleLeCTo: A rich lecture capture solution
typeConference Paper
contenttypeMetadata Only
identifier padid8129381
subject keywordsaluminium compounds
subject keywordsanodisation
subject keywordselectrodeposition
subject keywordselemental semiconductors
subject keywordsellipsometry
subject keywordspassivation
subject keywordsporosity
subject keywordsporous materials
subject keywordsrefractive index
subject keywordssilicon
subject keywordssolar cells
subject keywordsthin films
subject keywordstransmission electron microscopy
subject keywordsAl<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordsO<
subject keywordssub>
subject keywords3<
subject keywords/sub>
subject keywordsSi
subject keywordsaluminum precursor thickness
subject keywordsanodic aluminium oxide growth rate
subject keywordsantireflection effects
subject keywordsapplied voltage effects
subject keywordsbarrier layer thickness
subject keywordscrystalline silicon solar cells
subject keywordselectrochemical bath
subject keywordsellipsometry
subject keywordslight illumina
identifier doi10.1109/PVSC.2014.6925138
journal titlenformation and Communication Technology, Electronics and Microelectronics (MIPRO), 2014 37th Interna
filesize90870
citations0
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