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نمایش تعداد 1-8 از 8

Understanding the correlation of HCI and NBTI degradation in pLDMOSFETs from MR-DCIV technique

نوع: Conference Paper

نویسنده : Yandong He , Ganggang Zhang , Xing Zhang

ناشر: IEEE

سال: 2014

Understanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method

نوع: Conference Paper

نویسنده : Yandong He , Ganggang Zhang , Xing Zhang

ناشر: IEEE

سال: 2014

An investigation of endurance characteristic using PDO method in FLOTOX EEPROM structures

نوع: Journal Paper

نویسنده : Bing Xie; Yandong He; Miugzhen Xu; Changhua Tan

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An efficient test structure for interface trap characterization under BTI stresses

نوع: Conference Paper

نویسنده : Yandong He; Ganggang Zhang; Lin Han; Xing Zhang

ناشر: IEEE

سال: 2014

A Ring Oscillator based reliability structure for duty-cycle measurement under BTI stresses

نوع: Conference Paper

نویسنده : Lei Ai; Yandong He; Fang Qiao; Ganggang Zhang; Xing Zhang

ناشر: IEEE

سال: 2014

The beat-frequency circuit for monitoring duty-cycle shift based on BTI effect

نوع: Conference Paper

نویسنده : Fang Qiao; Yandong He; Ganggang Zhang; Xing Zhang

ناشر: IEEE

سال: 2014

A comprehensive NBTI degradation model based on ring oscillator circuit

نوع: Conference Paper

نویسنده : Fang Qiao; Yandong He; Leilei Ai; Ganggang Zhang; Xing Zhang

ناشر: IEEE

سال: 2014

Spatial and temporal variation in rainfall erosivity in a Himalayan watershed

نوع: Journal Paper

نویسنده : Xing Ma; Yandong He; Jianchu Xu; Meine van Noordwijk; Xixi Lu

سال: 2014

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Understanding the correlation of HCI and NBTI degradation in pLDMOSFETs from MR-DCIV technique

Understanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method

An investigation of endurance characteristic using PDO method in FLOTOX EEPROM structures

An efficient test structure for interface trap characterization under BTI stresses

A Ring Oscillator based reliability structure for duty-cycle measurement under BTI stresses

The beat-frequency circuit for monitoring duty-cycle shift based on BTI effect

A comprehensive NBTI degradation model based on ring oscillator circuit

Spatial and temporal variation in rainfall erosivity in a Himalayan watershed

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Understanding the correlation of HCI and NBTI degradation in pLDMOSFETs from MR-DCIV technique

Understanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method

An investigation of endurance characteristic using PDO method in FLOTOX EEPROM structures

An efficient test structure for interface trap characterization under BTI stresses

A Ring Oscillator based reliability structure for duty-cycle measurement under BTI stresses

The beat-frequency circuit for monitoring duty-cycle shift based on BTI effect

A comprehensive NBTI degradation model based on ring oscillator circuit

Spatial and temporal variation in rainfall erosivity in a Himalayan watershed