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نمایش تعداد 1-7 از 7

Tensile strength and the mining of black holes

نوع: Journal Paper

نویسنده : Brown A.R.

ناشر: American Physical Society

سال: 2013

3D coupled electro-thermal simulations for SOI FinFET with statistical variations including the fin shape dependence of the thermal conductivity

نوع: Conference Paper

نویسنده : Wang, L.; Brown, A.R.; Nedjalkov, M.; Alexander, C.; Cheng, B.; Millar, C.; Asenov, A.

ناشر: IEEE

سال: 2014

3D coupled electro-thermal FinFET simulations including the fin shape dependence of the thermal conductivity

نوع: Conference Paper

نویسنده : Wang, L.; Brown, A.R.; Nedjalkov, M.; Alexander, C.; Cheng, B.; Millar, C.; Asenov, A.

ناشر: IEEE

سال: 2014

Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability

نوع: Conference Paper

نویسنده : Xingsheng Wang; Binjie Cheng; Brown, A.R.; Millar, C.; Asenov, A.

ناشر: IEEE

سال: 2014

Inverse Scaling Trends for Charge-Trapping-Induced Degradation of FinFETs Performance

نوع: Journal Paper

نویسنده : Amoroso, S.M.; Georgiev, V.P.; Gerrer, L.; Towie, E.; Xingsheng Wang; Riddet, C.; Brown, A.R.; Asenov, A.

ناشر: IEEE

سال: 2014

Predictive simulation of future CMOS technologies and their impact on circuits

نوع: Conference Paper

نویسنده : Asenov, A.; Cheng, B.; Adamu-Lema, F.; Shifren, L.; Sinha, S.; Riddet, C.; Alexander, C.; Brown, A.R.; Wang, X.; Amoroso, S.M.

ناشر: IEEE

سال: 2014

Simultaneous simulation of systematic and stochastic process variations

نوع: Conference Paper

نویسنده : Lorenz, J.; Bar, E.; Burenkov, A.; Evanschitzky, P.; Asenov, A.; Wang, L.; Wang, X.; Brown, A.R.; Millar, C.; Reid, D.

ناشر: IEEE

سال: 2014

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Tensile strength and the mining of black holes

3D coupled electro-thermal simulations for SOI FinFET with statistical variations including the fin shape dependence of the thermal conductivity

3D coupled electro-thermal FinFET simulations including the fin shape dependence of the thermal conductivity

Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability

Inverse Scaling Trends for Charge-Trapping-Induced Degradation of FinFETs Performance

Predictive simulation of future CMOS technologies and their impact on circuits

Simultaneous simulation of systematic and stochastic process variations

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Tensile strength and the mining of black holes

3D coupled electro-thermal simulations for SOI FinFET with statistical variations including the fin shape dependence of the thermal conductivity

3D coupled electro-thermal FinFET simulations including the fin shape dependence of the thermal conductivity

Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability

Inverse Scaling Trends for Charge-Trapping-Induced Degradation of FinFETs Performance

Predictive simulation of future CMOS technologies and their impact on circuits

Simultaneous simulation of systematic and stochastic process variations