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RISImpacts of NBTI/PBTI on performance of domino logic circuits with high-k metal-gate devices in nanoscale CMOS
سال: 2012
خلاصه:
Negative-bias temperature instability (NBTI) and positive-bias temperature instability (PBTI) weaken
PFETs and high-k metal-gate NFETs, respectively. This paper provides comprehensive analyses on the
impacts of NBTI and PBTI on wide...
PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic
ناشر: IEEE
سال: 2014