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نمایش تعداد 1-9 از 9
Examination of voiding at the drain pad of high-power FETs
ناشر: IEEE
سال: 2014
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ناشر: IEEE
سال: 2014
Epileptic seizure detection using PCA on wavelet subbands
ناشر: IEEE
سال: 2014
Low-level features for inpainting quality assessment
ناشر: IEEE
سال: 2014
Efficient key-frame extraction based on unimodality of frame sequences
ناشر: IEEE
سال: 2014