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ICD lead failure detection through high frequency impedance
ناشر: IEEE
سال: 2014
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ناشر: IEEE
سال: 2014
Parallel ICA with multiple references: A semi-blind multivariate approach
ناشر: IEEE
سال: 2014
Effect of process pressure on PVD AlN thin film
ناشر: IEEE
سال: 2014
Mechanical characterization of ART-treated Jurkat cells using optical tweezers
ناشر: IEEE
سال: 2014
SWB process: A business process management system driven by semantic technologies
ناشر: IEEE
سال: 2014