Search

نمایش تعداد 1-6 از 6

A Fast <formula formulatype="inline"> <img src="/images/tex/21151.gif" alt="I{-}V"> </formula> Screening Measurement for TDDB Assessment of Ultra-Thick Inter-Metal Dielectrics

نوع: Journal Paper

نویسنده : Elhami Khorasani, Arash; Griswold, Mark; Alford, T.L.

ناشر: IEEE

سال: 2014

Modification of polyethylene properties by encapsulation of inorganic material

نوع: Journal Paper

نویسنده : Vanga-Bouanga, C.; Savoie, S.; Frechette, M.F.; David, E.

ناشر: IEEE

سال: 2014

Robust smoothing for estimating optical phase varying as a continuous resonant process

نوع: Conference Paper

ناشر: IEEE

سال: 2014

Gate Leakage Characteristics for 28 nm HfZrO<sub><italic>x</italic></sub> pMOSFETs After DPN Process Treatment With Different Nitrogen Concentration

نوع: Journal Paper

نویسنده : Win-Der Lee; Mu-Chun Wang; Shea-Jue Wang; Chun-Wei Lian; Huang, L.S.

ناشر: IEEE

سال: 2014

A Novel Noncontact Surface Potential Monitor for Dielectrics Under Electrons Irradiation

نوع: Journal Paper

نویسنده : Chaoyang Zhou; Shengsheng Yang; Yi Wang; Xiaogang Qin; Kai Tian

ناشر: IEEE

سال: 2014

A Wearable Wrap-Around Sensor for Monitoring Deep Tissue Electric Properties

نوع: Journal Paper

نویسنده : Salman, Safa; Lee, Lanlin Z.; Volakis, J.L.

ناشر: IEEE

سال: 2014

Search

A Fast <formula formulatype="inline"> <img src="/images/tex/21151.gif" alt="I{-}V"> </formula> Screening Measurement for TDDB Assessment of Ultra-Thick Inter-Metal Dielectrics

Modification of polyethylene properties by encapsulation of inorganic material

Robust smoothing for estimating optical phase varying as a continuous resonant process

Gate Leakage Characteristics for 28 nm HfZrO<sub><italic>x</italic></sub> pMOSFETs After DPN Process Treatment With Different Nitrogen Concentration

A Novel Noncontact Surface Potential Monitor for Dielectrics Under Electrons Irradiation

A Wearable Wrap-Around Sensor for Monitoring Deep Tissue Electric Properties

نویسنده

ناشر

سال

کلیدواژه

نوع

زبان

نوع محتوا

عنوان ناشر

Search

Filters

A Fast <formula formulatype="inline"> <img src="/images/tex/21151.gif" alt="I{-}V"> </formula> Screening Measurement for TDDB Assessment of Ultra-Thick Inter-Metal Dielectrics

Modification of polyethylene properties by encapsulation of inorganic material

Robust smoothing for estimating optical phase varying as a continuous resonant process

Gate Leakage Characteristics for 28 nm HfZrO<sub><italic>x</italic></sub> pMOSFETs After DPN Process Treatment With Different Nitrogen Concentration

A Novel Noncontact Surface Potential Monitor for Dielectrics Under Electrons Irradiation

A Wearable Wrap-Around Sensor for Monitoring Deep Tissue Electric Properties