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نمایش تعداد 1-10 از 40
Counter-vandalism at NDBC
ناشر: IEEE
سال: 2014
Use of SSTA Tools for Evaluating BTI Impact on Combinational Circuits
ناشر: IEEE
سال: 2014
Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates
ناشر: IEEE
سال: 2014
Design Framework to Overcome Aging Degradation of the 16 nm VLSI Technology Circuits
ناشر: IEEE
سال: 2014
BTI-Aware Sleep Transistor Sizing Algorithm for Reliable Power Gating Designs
ناشر: IEEE
سال: 2014