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Now showing items 1-9 of 9

Tackling close-to-band passivity violations in passive macro-modeling

Type: Conference Paper

Author : Moning Zhang , Zuochang Ye

Publisher: IEEE

Year: 2014

Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure Regions

Type: Journal Paper

Author : Jian Yao; Zuochang Ye; Yan Wang

Publisher: IEEE

Year: 2014

Efficient high-sigma yield analysis for high dimensional problems

Type: Conference Paper

Author : Moning Zhang , Zuochang Ye , Yan Wang

Publisher: IEEE

Year: 2014

A systematic design methodology for yield-driven near-threshold SRAM design

Type: Conference Paper

Author : Chengzhi Jiang; Zuochang Ye; Yan Wang

Publisher: IEEE

Year: 2014

Low-loss balun design and compact modeling for RF/millimeter-wave circuit application

Type: Conference Paper

Author : Jian Yao; Zuochang Ye; Yan Wang

Publisher: IEEE

Year: 2014

Scalable Compact Modeling for On-Chip Passive Elements with Correlated Parameter Extraction and Adaptive Boundary Compression

Type: Journal Paper

Author : Jian Yao; Zuochang Ye; Yan Wang

Publisher: IEEE

Year: 2014

A Low Power Inductorless Wideband LNA With Gm Enhancement and Noise Cancellation

Type: Journal Paper

Author : Zhijian Pan; Chuan Qin; Zuochang Ye; Yan Wang

Year: 2017

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3-D Analytical Model for Short-Channel Triple-Gate Junctionless MOSFETs

Type: Journal Paper

Author : Zebang Guo; Jinyu Zhang; Zuochang Ye; Yan Wang

Year: 2016

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Co-Design of 60-GHz Wideband Front-End IC With On-Chip T/R Switch Based on Passive Macro-Modeling

Type: Journal Paper

Author : Lixue Kuang; Baoyong Chi; Haikun Jia; Zuochang Ye; Wen Jia; Zhihua Wang

Publisher: IEEE

Year: 2014

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Tackling close-to-band passivity violations in passive macro-modeling

Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure Regions

Efficient high-sigma yield analysis for high dimensional problems

A systematic design methodology for yield-driven near-threshold SRAM design

Low-loss balun design and compact modeling for RF/millimeter-wave circuit application

Scalable Compact Modeling for On-Chip Passive Elements with Correlated Parameter Extraction and Adaptive Boundary Compression

A Low Power Inductorless Wideband LNA With Gm Enhancement and Noise Cancellation

3-D Analytical Model for Short-Channel Triple-Gate Junctionless MOSFETs

Co-Design of 60-GHz Wideband Front-End IC With On-Chip T/R Switch Based on Passive Macro-Modeling

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Tackling close-to-band passivity violations in passive macro-modeling

Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure Regions

Efficient high-sigma yield analysis for high dimensional problems

A systematic design methodology for yield-driven near-threshold SRAM design

Low-loss balun design and compact modeling for RF/millimeter-wave circuit application

Scalable Compact Modeling for On-Chip Passive Elements with Correlated Parameter Extraction and Adaptive Boundary Compression

A Low Power Inductorless Wideband LNA With Gm Enhancement and Noise Cancellation

3-D Analytical Model for Short-Channel Triple-Gate Junctionless MOSFETs

Co-Design of 60-GHz Wideband Front-End IC With On-Chip T/R Switch Based on Passive Macro-Modeling