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Now showing items 1-9 of 9
Etching of VO<inf>x</inf> thin film in HF solution
Publisher: IEEE
Year: 2014
Investigation of Ni(Pt)/Si-cap/SiGe solid phase reaction
Publisher: IEEE
Year: 2014
Effect of TiN capping layer on barrier inhomogeneities for TiSi<inf>x</inf>/Si Schottky diode
Publisher: IEEE
Year: 2014
Influence of Post-Annealing on Resistivity of VO<sub><italic>x</italic></sub> Thin Film
Publisher: IEEE
Year: 2014
Investigation of scattering mechanisms for scaled mosfets
Publisher: IEEE
Year: 2014