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RISUnderstanding the correlation of HCI and NBTI degradation in pLDMOSFETs from MR-DCIV technique
Publisher: IEEE
Year: 2014
Understanding of self-heating enhanced degradation in pLDMOSFETs by MR-DCIV method
Publisher: IEEE
Year: 2014
An efficient test structure for interface trap characterization under BTI stresses
Publisher: IEEE
Year: 2014
A Ring Oscillator based reliability structure for duty-cycle measurement under BTI stresses
Publisher: IEEE
Year: 2014
The beat-frequency circuit for monitoring duty-cycle shift based on BTI effect
Publisher: IEEE
Year: 2014
A comprehensive NBTI degradation model based on ring oscillator circuit
Publisher: IEEE
Year: 2014