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Author : Haiyang Wang; Xiaoping He; Weiqing Chen; Linshen Xie; Jingzhi Zhou; Binjie Xue; Fan Guo; Guowei Zhang; Zhiqiang Chen; Zhengzhong Zeng

Publisher: IEEE

Year: 2014

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Dielectric charging induced drift in micro device reliability-a review

Geology, geochemistry, and genesis of Axi: A Paleozoic low-sulfidation type epithermal gold deposit in Xinjiang, China

Degraded Switching Characteristics of a High-Current, High-Action Reversely Switched Dynistor

Investigation on Switching Energy Losses in Reversely Switched Dynistor

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Dielectric charging induced drift in micro device reliability-a review

Geology, geochemistry, and genesis of Axi: A Paleozoic low-sulfidation type epithermal gold deposit in Xinjiang, China

Degraded Switching Characteristics of a High-Current, High-Action Reversely Switched Dynistor

Investigation on Switching Energy Losses in Reversely Switched Dynistor