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GaAs-on-insulator fabricated via ion-cut in epitaxial GaAs /Ge substrate
Publisher: IEEE
Year: 2014
Investigation of band-to-band tunneling parameters in sige by using MOSFET GIDL current analysis
Publisher: IEEE
Year: 2014
Impact of communication failures on power system security and stability defense system
Publisher: IEEE
Year: 2014
Experimental Study on NBTI Degradation Behaviors in Si pMOSFETs Under Compressive and Tensile Strains
Publisher: IEEE
Year: 2014