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Author : Siddarth Krishnan; Vijay Narayanan; Eduard Cartier; Dimitris Ioannou; Kai Zhao; Takashi Ando; Unoh Kwon; Barry Linder; James Stathis; Michael Chudzik; Andreas Kerber; Kisik Choi

Year: 2012

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Model estimates of nitrous oxide emissions from agricultural lands in the United States

Technology assessment of Si and III-V FinFETs and III-V tunnel FETs from soft error rate perspective

Impact of Variation in Nanoscale Silicon and Non-Silicon FinFETs and Tunnel FETs on Device and SRAM Performance

Bias temperature instability in High-κ/metal gate transistors - Gate stack scaling trends

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Model estimates of nitrous oxide emissions from agricultural lands in the United States

Technology assessment of Si and III-V FinFETs and III-V tunnel FETs from soft error rate perspective

Impact of Variation in Nanoscale Silicon and Non-Silicon FinFETs and Tunnel FETs on Device and SRAM Performance

Bias temperature instability in High-κ/metal gate transistors - Gate stack scaling trends