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HALT, FOAT and their role in making a viable device into a reliable product

Type: Conference Paper

Author : Suhir, E.

Publisher: IEEE

Year: 2014

Reliability physics and probabilistic design for reliability (PDfR): Role, attributes, challenges

Type: Conference Paper

Author : Suhir, E.

Publisher: IEEE

Year: 2014

Statistics-related and reliability-physics-related failure processes in electronics devices and products

Type: Journal Paper

Author : Suhir, E., and E. Suhir.

Publisher: World Scientific Pub Co Pte Lt

Year: 2014

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Aerospace optoelectronics reliability: application of multi-parametric BAZ model

Type: Conference Paper

Author : Suhir, E. , Bensoussan, A.

Publisher: IEEE

Year: 2014

Designing with consideration of the human factor: Changing the paradigm for higher safety

Type: Conference Paper

Author : Hourlier, S. , Suhir, E.

Publisher: IEEE

Year: 2014

Some major guiding principles to make future manned missions to mars safe and reliable

Type: Conference Paper

Author : Salotti, J.-M. , Suhir, E.

Publisher: IEEE

Year: 2014

Aerospace electronic and photonic packaging: Predicted thermal stresses in Bi- and tri-material assemblies

Type: Conference Paper

Author : Suhir, E. , Nicolics, J. , Bechou, L.

Publisher: IEEE

Year: 2014

Crew size impact on the design, risks and cost of a human mission to mars

Type: Conference Paper

Author : Salotti, J.-M. , Heidmann, R. , Suhir, E.

Publisher: IEEE

Year: 2014

Thermomechanical stress analysis of copper/silicon interface in through silicon vias using FEM simulations and experimental analysis

Type: Conference Paper

Author : Remili, Z.; Ousten, Y.; Levrier, B.; Mercier, D.; Suhir, E.; Bechou, L.

Publisher: IEEE

Year: 2014

Towards adequate qualification testing of electronic products: Review and extension

Type: Conference Paper

Author : Khatibi, G.; Czerny, B.; Magnien, J.; Lederer, M.; Suhir, E.; Nicolics, J.

Publisher: IEEE

Year: 2014

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HALT, FOAT and their role in making a viable device into a reliable product

Reliability physics and probabilistic design for reliability (PDfR): Role, attributes, challenges

Statistics-related and reliability-physics-related failure processes in electronics devices and products

Aerospace optoelectronics reliability: application of multi-parametric BAZ model

Designing with consideration of the human factor: Changing the paradigm for higher safety

Some major guiding principles to make future manned missions to mars safe and reliable

Aerospace electronic and photonic packaging: Predicted thermal stresses in Bi- and tri-material assemblies

Crew size impact on the design, risks and cost of a human mission to mars

Thermomechanical stress analysis of copper/silicon interface in through silicon vias using FEM simulations and experimental analysis

Towards adequate qualification testing of electronic products: Review and extension

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HALT, FOAT and their role in making a viable device into a reliable product

Reliability physics and probabilistic design for reliability (PDfR): Role, attributes, challenges

Statistics-related and reliability-physics-related failure processes in electronics devices and products

Aerospace optoelectronics reliability: application of multi-parametric BAZ model

Designing with consideration of the human factor: Changing the paradigm for higher safety

Some major guiding principles to make future manned missions to mars safe and reliable

Aerospace electronic and photonic packaging: Predicted thermal stresses in Bi- and tri-material assemblies

Crew size impact on the design, risks and cost of a human mission to mars

Thermomechanical stress analysis of copper/silicon interface in through silicon vias using FEM simulations and experimental analysis

Towards adequate qualification testing of electronic products: Review and extension