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    Effectiveness Analysis of a Non-Destructive Single Event Burnout Test Methodology 

    Type: Journal Paper
    Author : Oser, P.; Mekki, J.; Spiezia, G.; Fadakis, E.; Foucard, G.; Peronnard, P.; Masi, A.; Gaillard, R.
    Publisher: IEEE
    Year: 2014

    Characterization and Modeling of a Floating Gate Dosimeter with Gamma and Protons at Various Energies 

    Type: Journal Paper
    Author : Danzeca, S.; Cesari, J.; Brugger, M.; Dusseau, L.; Masi, A.; Pineda, A.; Spiezia, G.
    Publisher: IEEE
    Year: 2014

    Energy Dependence of Tungsten-Dominated SEL Cross Sections 

    Type: Journal Paper
    Author : Alia, R. Garcia; Brugger, M.; Danzeca, S.; Ferlet-Cavrois, Veronique; Poivey, C.; Roed, Ketil; Saigne, F.; Spiezia, G.; Uznanski, Slawosz; Saigne, F.
    Publisher: IEEE
    Year: 2014

    A New RadMon Version for the LHC<newline/> and its Injection Lines 

    Type: Journal Paper
    Author : Spiezia, G.; Peronnard, P.; Masi, A.; Brugger, M.; Brucoli, Maria; Danzeca, S.; Alia, R. Garcia; Losito, R.; Mekki, J.; Oser, P.; Gaillard, R.; Dusseau, L.
    Publisher: IEEE
    Year: 2014

    Qualification and Characterization of SRAM Memories Used as Radiation Sensors in the LHC 

    Type: Journal Paper
    Author : Danzeca, S.; Spiezia, G.; Brugger, M.; Dusseau, L.; Foucard, G.; Alia, R. Garcia; Mala, P.; Masi, A.; Peronnard, P.; Soltes, J.; Thornton, A.; Viererbl, L.
    Publisher: IEEE
    Year: 2014

    Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics 

    Type: Conference Paper
    Author : Oser, P.; Spiezia, G.; Brugger, M.; Danzeca, S.; Fadakis, E.; Foucard, G.; Garcia Alia, R.; Losito, R.; Masi, A.; Mekki, J.; Peronnard, P.; Ruggiero, G.; Secondo, R.; Stachyra, K.; Gaillard, R.
    Publisher: IEEE
    Year: 2014

    SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate 

    Type: Journal Paper
    Author : Alia, R. Garcia; Blackmore, Ewart W.; Brugger, M.; Danzeca, S.; Ferlet-Cavrois, Veronique; Gaillard, R.; Mekki, J.; Poivey, C.; Roed, Ketil; Saigne, F.; Spiezia, G.; Trinczek, Michael; Uznanski, Slawosz; Wrobel, F.
    Publisher: IEEE
    Year: 2014

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