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Now showing items 1-6 of 6
Observation of Large Exchange Bias Effect in Bulk Mn<sub>50</sub>Ni<sub>41</sub>Sn<sub>9</sub> Heusler Alloy
Publisher: IEEE
Year: 2014
Etch-hole design in encapsulation for better robustness
Publisher: IEEE
Year: 2014
Robust Pop-Up Shape Encapsulation Using Dual-Sealing
Publisher: IEEE
Year: 2014
Air-gap in encapsulation for fast release and safe sealing
Publisher: IEEE
Year: 2014
Calibrations for Millimeter-Wave Silicon Transistor Characterization
Publisher: IEEE
Year: 2014