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    Adaptive real-time DSP acceleration for SoC applications 

    Type: Conference Paper
    Author : Nsame, Pascal , Bois, Guy , Savaria, Yvon
    Publisher: IEEE
    Year: 2014

    Vt-conscious repeater insertion in power-managed VLSI 

    Type: Conference Paper
    Author : Zarrabi, Houman; Al-Khalili, Asim; Savaria, Yvon
    Publisher: IEEE
    Year: 2014

    [IEEE APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Macao, China (2008.11.30-2008.12.3)] APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems - A very-high output impedance current mirror for very-low voltage biomedical analog circuits 

    Type: Journal Paper
    Author : Tanguay, Louis-Francois; Sawan, Mohamad; Savaria, Yvon
    Year: 2008
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    Optimizing the Parallel Tree-Search for Finding Shortest-Span Error-Correcting CDO Codes 

    Type: Journal Paper
    Author : Kowarzyk, Gilbert; Belanger, Normand; Haccoun, David; Savaria, Yvon
    Publisher: IEEE
    Year: 2014

    A Configurable Multi-Rail Power and I/O Pad Applied to Wafer-Scale Systems 

    Type: Journal Paper
    Author : Laflamme-Mayer, Nicolas; Blaquiere, Yves; Savaria, Yvon; Sawan, Mohamad
    Publisher: IEEE
    Year: 2014

    [IEEE 2011 IEEE/AIAA 30th Digital Avionics Systems Conference (DASC) - Seattle, WA, USA (2011.10.16-2011.10.20)] 2011 IEEE/AIAA 30th Digital Avionics Systems Conference - A tight end-to-end delay bound and scheduling optimization of an avionics AFDX network 

    Type: Journal Paper
    Author : Tawk, Melhem; Zhu, Guchuan; Savaria, Yvon; Liu, Xue; Li, Jian; Hu, Fei
    Year: 2011
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    New Insights Into the Single Event Transient Propagation Through Static and TSPC Logic 

    Type: Journal Paper
    Author : Hamad, Ghaith Bany; Hasan, Syed Rafay; Mohamed, O. Ait; Savaria, Yvon
    Publisher: IEEE
    Year: 2014

    On Extra Delays Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiation 

    Type: Journal Paper
    Author : Tazi, Fatima Zahra; Thibeault, Claude; Savaria, Yvon; Pichette, Simon; Audet, Yves
    Publisher: IEEE
    Year: 2014

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