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TCAD simulation of interface traps related variability in bulk decananometer mosfets

Type: Conference Paper

Author : Velayudhan, V.; Martin-Martinez, J.; Rodriguez, R.; Porti, M.; Nafria, M.; Aymerich, X.; Medina, C.; Gamiz, F.

Publisher: IEEE

Year: 2014

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

Type: Journal Paper

Author : Qian Wu; Bayerl, A.; Porti, M.; Martin-Martinez, J.; Lanza, Mario; Rodriguez, Roberto; Velayudhan, V.; Nafria, M.; Aymerich, X.; Bargallo Gonzalez, Mireia; Simoen, Eddy

Publisher: IEEE

Year: 2014

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TCAD simulation of interface traps related variability in bulk decananometer mosfets

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

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TCAD simulation of interface traps related variability in bulk decananometer mosfets

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs