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Now showing items 1-9 of 9

Device Size-Dependent Improved Resistive Switching Memory Performance

Type: Journal Paper

Author : Prakash, Aravind; Maikap, S.; Wei-Su Chen; Heng-Yuan Lee; Chen, Fan; Ta-Chang Tien; Chao-Sung Lai; Ming-Jinn Tsai

Publisher: IEEE

Year: 2014

Low Store Energy, Low VDDmin, 8T2R Nonvolatile Latch and SRAM With Vertical-Stacked Resistive Memory (Memristor) Devices for Low Power Mobile Applications

Type: Journal Paper

Author : Pi-Feng Chiu; Meng-Fan Chang; Che-Wei Wu; Ching-Hao Chuang; Shyh-Shyuan Sheu; Yu-Sheng Chen; Ming-Jinn Tsai

Year: 2012

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Magnetic Wireless Interlayer Transmission Through Perpendicular MTJ for 3-D IC Applications

Type: Journal Paper

Author : Liang-Shun Chang; Ching-Hua Wang; Kun-Yu Dai; Kuei-Hung Shen; Ming-Jinn Tsai; Chrong Jung Lin; Ya-Chin King

Publisher: IEEE

Year: 2014

Via Diode in Cu Backend Process for 3D Cross-Point RRAM Arrays

Type: Journal Paper

Author : Yu-Cheng Liao; Hsin-Wei Pan; Min-Che Hsieh; Tzong-Sheng Chang; Yu-Der Chih; Ming-Jinn Tsai; Chrong Jung Lin; Ya-Chin King

Publisher: IEEE

Year: 2014

Metal–Oxide RRAM

Type: Journal Paper

Author : Wong, H.-S.P.; Heng-Yuan Lee; Shimeng Yu; Yu-Sheng Chen; Yi Wu; Pang-Shiu Chen; Byoungil Lee; Chen, F.T.; Ming-Jinn Tsai

Year: 2012

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Novel Defects-Trapping <formula formulatype="inline"> <img src="/images/tex/21375.gif" alt="{\\rm TaO}_{\\rm X}/{\\rm HfO}_{\\rm X}"> </formula> RRAM With Reliable Self-Compliance, High Nonlinearity, and Ultra-Low Current

Type: Journal Paper

Author : Yu-Sheng Chen; Heng-Yuan Lee; Pang-Shiu Chen; Wei-Su Chen; Kan-Hsueh Tsai; Pei-Yi Gu; Tai-Yuan Wu; Chen-Han Tsai; Rahaman, S.Z.; Yu-De Lin; Chen, Fan; Ming-Jinn Tsai; Tzu-Kun Ku

Publisher: IEEE

Year: 2014

Area-Efficient Embedded Resistive RAM (ReRAM) Macros Using Logic-Process Vertical-Parasitic-BJT (VPBJT) Switches and Read-Disturb-Free Temperature-Aware Current-Mode Read Scheme

Type: Journal Paper

Author : Meng-Fan Chang; Chia-Chen Kuo; Shyh-Shyuan Sheu; Chorng-Jung Lin; Ya-Chin King; Chen, F.T.; Tzu-Kun Ku; Ming-Jinn Tsai; Jui-Jen Wu; Yue-Der Chih

Publisher: IEEE

Year: 2014

Influence of Oxygen Concentration on Self-Compliance RRAM in Indium Oxide Film

Type: Journal Paper

Author : Jyun-Bao Yang; Ting-Chang Chang; Jheng-Jie Huang; Yu-Ting Chen; Hsueh-Chih Tseng; Ann-Kuo Chu; Sze, Simon M.; Ming-Jinn Tsai; Jin-Cheng Zheng; Ding-Hua Bao

Publisher: IEEE

Year: 2014

A ReRAM integrated 7T2R non-volatile SRAM for normally-off computing application

Type: Journal Paper

Author : Shyh-Shyuan Sheu; Chia-Chen Kuo; Meng-Fan Chang; Pei-Ling Tseng; Lin Chih-Sheng; Min-Chuan Wang; Chih-He Lin; Wen-Pin Lin; Tsai-Kan Chien; Sih-Han Lee; Szu-Chieh Liu; Heng-Yuan Lee; Pang-Shiu Chen; Yu-Sheng Chen; Ching-Chih Hsu; Frederick T. Chen; Keng-Li Su; Tzu-Kun Ku; Ming-Jinn Tsai; Ming-Jer Kao

Year: 2013

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Device Size-Dependent Improved Resistive Switching Memory Performance

Low Store Energy, Low VDDmin, 8T2R Nonvolatile Latch and SRAM With Vertical-Stacked Resistive Memory (Memristor) Devices for Low Power Mobile Applications

Magnetic Wireless Interlayer Transmission Through Perpendicular MTJ for 3-D IC Applications

Via Diode in Cu Backend Process for 3D Cross-Point RRAM Arrays

Metal–Oxide RRAM

Novel Defects-Trapping <formula formulatype="inline"> <img src="/images/tex/21375.gif" alt="{\\rm TaO}_{\\rm X}/{\\rm HfO}_{\\rm X}"> </formula> RRAM With Reliable Self-Compliance, High Nonlinearity, and Ultra-Low Current

Area-Efficient Embedded Resistive RAM (ReRAM) Macros Using Logic-Process Vertical-Parasitic-BJT (VPBJT) Switches and Read-Disturb-Free Temperature-Aware Current-Mode Read Scheme

Influence of Oxygen Concentration on Self-Compliance RRAM in Indium Oxide Film

A ReRAM integrated 7T2R non-volatile SRAM for normally-off computing application

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Device Size-Dependent Improved Resistive Switching Memory Performance

Low Store Energy, Low VDDmin, 8T2R Nonvolatile Latch and SRAM With Vertical-Stacked Resistive Memory (Memristor) Devices for Low Power Mobile Applications

Magnetic Wireless Interlayer Transmission Through Perpendicular MTJ for 3-D IC Applications

Via Diode in Cu Backend Process for 3D Cross-Point RRAM Arrays

Metal–Oxide RRAM

Novel Defects-Trapping <formula formulatype="inline"> <img src="/images/tex/21375.gif" alt="{\\rm TaO}_{\\rm X}/{\\rm HfO}_{\\rm X}"> </formula> RRAM With Reliable Self-Compliance, High Nonlinearity, and Ultra-Low Current

Area-Efficient Embedded Resistive RAM (ReRAM) Macros Using Logic-Process Vertical-Parasitic-BJT (VPBJT) Switches and Read-Disturb-Free Temperature-Aware Current-Mode Read Scheme

Influence of Oxygen Concentration on Self-Compliance RRAM in Indium Oxide Film

A ReRAM integrated 7T2R non-volatile SRAM for normally-off computing application