Search

Now showing items 1-10 of 11

Non-quasi-static small-signal modeling and analytical parameter extraction of SOI FinFETs

Type: Journal Paper

Author : In Man Kang; Hyungcheol Shin

Year: 2006

Request PDF

A simple and analytical parameter-extraction method of a microwave MOSFET

Type: Journal Paper

Author : Ickjin Kwon; Minkyu Je; Kwyro Lee; Hyungcheol Shin

Year: 2002

Request PDF

Device Investigation of Nanoplate Transistor With Spacer Materials

Type: Journal Paper

Author : Hyungwoo Ko; Myounggon Kang; Jongwook Jeon; Hyungcheol Shin

Year: 2019

Request PDF

Extraction of trap energy and location from random telegraph noise in gate leakage current (Ig RTN) of metal–oxide semiconductor field effect transistor (MOSFET)

Type: Journal Paper

Author : Heung-Jae Cho; Sanghoon Lee; Byung-Gook Park; Hyungcheol Shin

Year: 2010

Request PDF

Analysis of Electrothermal Characteristics of GAA Vertical Nanoplate-Shaped FETs

Type: Journal Paper

Author : Dokyun Son; Ilho Myeong; Hyunsuk Kim; Myounggon Kang; Jongwook Jeon; Hyungcheol Shin

Year: 2018

Request PDF

Analysis on Self-Heating Effects in Three-Stacked Nanoplate FET

Type: Journal Paper

Author : Hyunsuk Kim; Dokyun Son; Ilho Myeong; Myounggon Kang; Jongwook Jeon; Hyungcheol Shin

Year: 2018

Request PDF

Separation of Corner Component in TAT Mechanism in Retention Characteristics of Sub 20-nm NAND Flash Memory

Type: Journal Paper

Author : Kyunghwan Lee; Myounggon Kang; Seongjun Seo; Duckseoung Kang; Dong Hua Li; Yuchul Hwang; Hyungcheol Shin

Publisher: IEEE

Year: 2014

Probability Level Dependence of Failure Mechanisms in Sub-20 nm NAND Flash Memory

Type: Journal Paper

Author : Duckseoung Kang; Kyunghwan Lee; Myounggon Kang; Seongjun Seo; Dong Hua Li; Yuchul Hwang; Hyungcheol Shin

Publisher: IEEE

Year: 2014

Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory

Type: Conference Paper

Author : Kyunghwan Lee; Duckseoung Kang; Hyungcheol Shin; Sangjin Kwon; Shinhyung Kim; Yuchul Hwang

Publisher: IEEE

Year: 2014

A novel gated transmission line method for organic thin film transistors

Type: Journal Paper

Author : Keum-Dong Jung; Byeong-Ju Kim; Yoo Chul Kim; Byung-Gook Park; Hyungcheol Shin; Jong Duk Lee

Year: 2007

Request PDF

Search

Non-quasi-static small-signal modeling and analytical parameter extraction of SOI FinFETs

A simple and analytical parameter-extraction method of a microwave MOSFET

Device Investigation of Nanoplate Transistor With Spacer Materials

Extraction of trap energy and location from random telegraph noise in gate leakage current (Ig RTN) of metal–oxide semiconductor field effect transistor (MOSFET)

Analysis of Electrothermal Characteristics of GAA Vertical Nanoplate-Shaped FETs

Analysis on Self-Heating Effects in Three-Stacked Nanoplate FET

Separation of Corner Component in TAT Mechanism in Retention Characteristics of Sub 20-nm NAND Flash Memory

Probability Level Dependence of Failure Mechanisms in Sub-20 nm NAND Flash Memory

Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory

A novel gated transmission line method for organic thin film transistors

Author

Publisher

Year

Keywords

Type

Language (ISO)

Content Type

Publication Title

Search

Filters

Non-quasi-static small-signal modeling and analytical parameter extraction of SOI FinFETs

A simple and analytical parameter-extraction method of a microwave MOSFET

Device Investigation of Nanoplate Transistor With Spacer Materials

Extraction of trap energy and location from random telegraph noise in gate leakage current (Ig RTN) of metal–oxide semiconductor field effect transistor (MOSFET)

Analysis of Electrothermal Characteristics of GAA Vertical Nanoplate-Shaped FETs

Analysis on Self-Heating Effects in Three-Stacked Nanoplate FET

Separation of Corner Component in TAT Mechanism in Retention Characteristics of Sub 20-nm NAND Flash Memory

Probability Level Dependence of Failure Mechanisms in Sub-20 nm NAND Flash Memory

Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory

A novel gated transmission line method for organic thin film transistors