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Author : Chauhan, Yogesh Singh; Venugopalan, Sarad; Chalkiadaki, Maria-Anna; Karim, Muhammed Ahosan Ul; Agarwal, Harshit; Khandelwal, Sourabh; Paydavosi, Navid; Duarte, Juan Pablo; Enz, C.C.; Niknejad, Ali M.; Chenming Hu

Publisher: IEEE

Year: 2014

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Compact modeling of thermal noise in the MOS transistor

Circuit techniques for reducing the effects of op-amp imperfections: autozeroing, correlated double sampling, and chopper stabilization

A CMOS chopper amplifier

Compact modeling of gate sidewall capacitance of DG-MOSFET

Foreword Special Issue on Compact Modeling of Emerging Devices

Submicrometer Organic Thin-Film Transistors: Technology Assessment Through Noise Margin Analysis of Inverters

BSIM6: Analog and RF Compact Model for Bulk MOSFET

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Compact modeling of thermal noise in the MOS transistor

Circuit techniques for reducing the effects of op-amp imperfections: autozeroing, correlated double sampling, and chopper stabilization

A CMOS chopper amplifier

Compact modeling of gate sidewall capacitance of DG-MOSFET

Foreword Special Issue on Compact Modeling of Emerging Devices

Submicrometer Organic Thin-Film Transistors: Technology Assessment Through Noise Margin Analysis of Inverters

BSIM6: Analog and RF Compact Model for Bulk MOSFET