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Now showing items 1-7 of 7

Biodiesel: an Alternative to Conventional Fuel

Type: Journal Paper

Author : Daming Huang; Haining Zhou; Lin Lin

Year: 2012

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Challenges for InGaAs n-MOSFETs in the future generation sub-10nm CMOS logic devices

Type: Conference Paper

Author : Ming-Fu Li; Shenwei Li; Daming Huang; Ye, P.D.

Publisher: IEEE

Year: 2014

Mixotrophic Chlorella sp. UJ-3 cultivation in the typical anaerobic fermentation effluents

Type: Journal Paper

Author : Shuhao Huo; Miao Kong; Feifei Zhu; Bin Zou; Feng Wang; Ling Xu; Cunsheng Zhang; Daming Huang

Year: 2018

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Characteristics of low frequency noise in n+Si-HfO<inf>2</inf>-Ni resistive random access memory

Type: Conference Paper

Author : Yadong Zhao; Daming Huang; Dongyi Lu; Tran Xuan Anh; Hongyu Yu; Ming-Fu Li

Publisher: IEEE

Year: 2014

Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure

Type: Journal Paper

Author : Wei Cao; Yao, C.J.; Jiao, G.F.; Daming Huang; Yu, H.Y.; Ming-Fu Li

Year: 2011

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Reliability of High-Mobility InGaAs Channel n-MOSFETs Under BTI Stress

Type: Journal Paper

Author : Ming-Fu Li; Guangfan Jiao; Yaodong Hu; Yi Xuan; Daming Huang; Peide D. Ye

Year: 2013

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Investigations of Conduction Mechanisms of the Self-Rectifying n+Si-HfO2–Ni RRAM Devices

Type: Journal Paper

Author : Dongyi Lu; Yadong Zhao; Tran Xuan Anh; Yu Hong Yu; Daming Huang; Yinyin Lin; Shi-Jin Ding; Peng-Fei Wang; Ming-Fu Li

Publisher: IEEE

Year: 2014

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Biodiesel: an Alternative to Conventional Fuel

Challenges for InGaAs n-MOSFETs in the future generation sub-10nm CMOS logic devices

Mixotrophic Chlorella sp. UJ-3 cultivation in the typical anaerobic fermentation effluents

Characteristics of low frequency noise in n<sup>+</sup>Si-HfO<inf>2</inf>-Ni resistive random access memory

Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure

Reliability of High-Mobility InGaAs Channel n-MOSFETs Under BTI Stress

Investigations of Conduction Mechanisms of the Self-Rectifying n<sup>+</sup>Si-HfO<sub>2</sub>–Ni RRAM Devices

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Biodiesel: an Alternative to Conventional Fuel

Challenges for InGaAs n-MOSFETs in the future generation sub-10nm CMOS logic devices

Mixotrophic Chlorella sp. UJ-3 cultivation in the typical anaerobic fermentation effluents

Characteristics of low frequency noise in n<sup>+</sup>Si-HfO<inf>2</inf>-Ni resistive random access memory

Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure

Reliability of High-Mobility InGaAs Channel n-MOSFETs Under BTI Stress

Investigations of Conduction Mechanisms of the Self-Rectifying n<sup>&#x002B;</sup>Si-HfO<sub>2</sub>&#x2013;Ni RRAM Devices

Investigations of Conduction Mechanisms of the Self-Rectifying n<sup>+</sup>Si-HfO<sub>2</sub>–Ni RRAM Devices