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System-level ESD failure diagnosis with chip-package-system dynamic ESD simulation

Type: Conference Paper

Author : Myoung, Robert; Seol, Byong-su; Chang, Norman

Publisher: IEEE

Year: 2014

HBM failure diagnosis on a high-frequency analog design with full-chip dynamic ESD simulation

Type: Conference Paper

Author : Tong, Paul; Tam, Anna; Xu, Ping Ping; Lin, KS; Hui, John; Chang, Norman; Hu, Bo; Srinivasan, Karthik; Schmitt, Margaret

Publisher: IEEE

Year: 2014

Bad page relaxation to prolong the lifetime of flash devices

Type: Conference Paper

Author : Yang, Ming-Chang; Kuan, Yuan-Hung; Chang, Yuan-Hao; Suei, Pei-Lun; Tu, Chia-Heng; Chang, Norman

Publisher: IEEE

Year: 2014

Author

Chang, Norman (3)

Chang, Yuan-Hao (1)

Hu, Bo (1)

Hui, John (1)

Kuan, Yuan-Hung (1)

Lin, KS (1)

Myoung, Robert (1)

Schmitt, Margaret (1)

Seol, Byong-su (1)

Srinivasan, Karthik (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

n Resistance (2)

n wireless sensor networks (2)

energy conservation (1)

inductive power transmission (1)

n Algorithm design and analysis (1)

n circuit parameters (1)

n closed-form formulas (1)

n Coils (1)

n Convergence (1)

n convergence (1)

Type

Conference Paper (3)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

lectrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th (2)

onsumer Electronics (GCCE), 2014 IEEE 3rd Global Conference on (1)

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