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Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic

Type: Conference Paper

Author : Breitkreutz, Stephan; Eichwald, Irina; Ziemys, Grazvydas; Schmitt-Landsiedel, Doris; Becherer, Markus

Publisher: IEEE

Year: 2014

Threshold Gate-Based Circuits From Nanomagnetic Logic

Type: Journal Paper

Author : Papp, Adam; Niemier, Michael T.; Csurgay, Arpad; Becherer, Markus; Breitkreutz, Stephan; Kiermaier, Josef; Eichwald, Irina; Hu, Xiaobo Sharon; Xueming Ju; Porod, Wolfgang; Csaba, Gyorgy

Publisher: IEEE

Year: 2014

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Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic

Threshold Gate-Based Circuits From Nanomagnetic Logic

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Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic

Threshold Gate-Based Circuits From Nanomagnetic Logic