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    OPTIMUS: OPTImized Mail distribUtion System 

    Type: Conference Paper
    Author : Rosato, F.; Arguello, J.; Cardinale, Y.
    Publisher: IEEE
    Year: 2014

    TSV Cu Filling Failure Modes and Mechanisms Causing the Failures 

    Type: Journal Paper
    Author : Jae Woong Choi; Ong Lee Guan; Mao Yingjun; Yusoff, Hilmi B. Mohamad; Xie Jielin; Chow Choi Lan; Woon Lengv Loh; Boon Long Lau; Hong, Linda Liew Hwee; Lau Guan Kian; Murthy, Ramana; Kiat, Eugene Tan Swee
    Publisher: IEEE
    Year: 2014

    Recognition of single and multiple partial discharge sources in transformers based on ultra-high frequency signals 

    Type: Journal Paper
    Author : Sinaga, Herman H.; Phung, B.T.; Blackburn, T.R.
    Publisher: IET
    Year: 2014

    Statistical Modeling of Glitching Effects in Estimation of Dynamic Power Consumption 

    Type: Conference Paper
    Author : Meixner, M. , Noll, T.G.
    Year: 2014

    The Electromagnetic Articulography Mandarin Accented English (EMA-MAE) corpus of acoustic and 3D articulatory kinematic data 

    Type: Conference Paper
    Author : An Ji , Berry, J.J. , Johnson, M.T.
    Publisher: IEEE
    Year: 2014

    The natural scale of signals: Pulse duration and superoscillations 

    Type: Conference Paper
    Author : Ferreira, P.J.S.G. , Pinho, A.J.
    Publisher: IEEE
    Year: 2014

    Separation and classification of underwater acoustic sources 

    Type: Conference Paper
    Author : Rahmati, Mehdi; Pandey, Parul; Pompili, Dario
    Publisher: IEEE
    Year: 2014

    Simulation of electron escape from GaNAs/GaAs quantum well solar cells 

    Type: Conference Paper
    Author : Yongjie Zou; Honsberg, C.B.; Freundlich, A.; Goodnick, S.M.
    Publisher: IEEE
    Year: 2014

    A measurement chain for the determination of RK using a calculable capacitor 

    Type: Conference Paper
    Author : Fletcher, Nick , Goebel, Roland
    Publisher: IEEE
    Year: 2014

    Development of exposed die large body to die size ratio wafer level package technology 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014
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