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Total Ionizing Dose Effects on DRAM Data Retention Time

Type: Journal Paper

Author : Bacchini, Angelo; Furano, Gianluca; Rovatti, Marco; Ottavi, Marco

Publisher: IEEE

Year: 2014

Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers

Type: Journal Paper

Author : Diggins, Zachary J.; Mahadevan, Nagabhushan; Herbison, Dan; Karsai, Gabor; Sierawski, Brian D.; Barth, Eric; Pitt, E. Bryn; Reed, R.A.; Schrimpf, R.D.; Weller, Robert /A/.; Alles, Michael L.; Witulski, Arthur

Publisher: IEEE

Year: 2014

Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Type: Journal Paper

Author : Joon-Bae Moon; Dong-Il Moon; Yang-Kyu Choi

Publisher: IEEE

Year: 2014

Sizing of concentrated-wound permanent-magnet machines using thermal analysis

Type: Conference Paper

Author : Baker, J.L. , Drury, D. , Mellor, P.H.

Publisher: IEEE

Year: 2014

Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

Type: Journal Paper

Author : Chao Peng; Zhiyuan Hu; Bingxu Ning; Huixiang Huang; Zhengxuan Zhang; Dawei Bi; Yunfei En; Shichang Zou

Publisher: IEEE

Year: 2014

Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation

Type: Journal Paper

Author : Lili Ding; Hongxia Guo; Wei Chen; Zhibin Yao; Yihua Yan; Dongliang Chen; Paccagnella, Alessandro; Gerardin, Simone; Bagatin, Marta; Lei Chen; Huabo Sun; Ruyu Fan

Publisher: IEEE

Year: 2014

Ground Penetrating Radar's performance against different types of surfaces. Study case of the ‘Casino of Officers’, City of Buenos Aires, Argentina

Type: Conference Paper

Author : Bonato, Cesar; Elichiri, Pamela A.; Lopez, Eduardo D.; Pasik, Barbara; Dushevskyy, Aleks

Publisher: IEEE

Year: 2014

Total Ionizing Dose Retention Capability of Conductive Bridging Random Access Memory

Type: Journal Paper

Author : Gonzalez-Velo, Y.; Barnaby, H.J.; Kozicki, M.N.; Gopalan, Chakravarthy; Holbert, Keith

Publisher: IEEE

Year: 2014

A Capability Maturity Model for R&M engineering

Type: Conference Paper

Author : van Baaren, R.J. , Curran, R.

Publisher: IEEE

Year: 2014

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

Type: Conference Paper

Author : Nath, K. , Dhar, S. , Basishtha, S.

Publisher: IEEE

Year: 2014

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Total Ionizing Dose Effects on DRAM Data Retention Time

Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers

Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Sizing of concentrated-wound permanent-magnet machines using thermal analysis

Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation

Ground Penetrating Radar's performance against different types of surfaces. Study case of the ‘Casino of Officers’, City of Buenos Aires, Argentina

Total Ionizing Dose Retention Capability of Conductive Bridging Random Access Memory

A Capability Maturity Model for R&M engineering

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

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Total Ionizing Dose Effects on DRAM Data Retention Time

Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers

Influence of Total Ionizing Dose on Sub-100&#x00A0;nm Gate-All-Around MOSFETs

Sizing of concentrated-wound permanent-magnet machines using thermal analysis

Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation

Ground Penetrating Radar's performance against different types of surfaces. Study case of the &#x2018;Casino of Officers&#x2019;, City of Buenos Aires, Argentina

Total Ionizing Dose Retention Capability of Conductive Bridging Random Access Memory

A Capability Maturity Model for R&amp;M engineering

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Ground Penetrating Radar's performance against different types of surfaces. Study case of the ‘Casino of Officers’, City of Buenos Aires, Argentina

A Capability Maturity Model for R&M engineering