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A Compact Interface-Trapped-Charge-Induced Subthreshold Current Model for Surrounding-Gate MOSFETs

Type: Journal Paper

Author : Te-Kuang Chiang

Publisher: IEEE

Year: 2014

A Novel Quasi-3-D Interface-Trapped-Charge-Induced Threshold Voltage Model for Quadruple-Gate MOSFETs, Including Equivalent Number of Gates

Type: Journal Paper

Author : Chiang Te-Kuang

Publisher: IEEE

Year: 2014

Data collection for models validation: Application to prostate cancer — Clinical aspects

Type: Conference Paper

Publisher: IEEE

Year: 2014

Author

Chiang Te-Kuang (1)

Te-Kuang Chiang (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

Logic gates (2)

Mathematical model (2)

MOSFET (2)

Semiconductor device modeling (2)

semiconductor device models (2)

Silicon (2)

thin gate oxide (2)

Bulk scaling equation (1)

CMOS integrated circuits (1)

CMOS logic circuits (1)

Type

Journal Paper (2)

Conference Paper (1)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

Device and Materials Reliability, IEEE Transactions on (1)

Electron Devices, IEEE Transactions on (1)

iomedical and Health Informatics (BHI), 2014 IEEE-EMBS International Conference on (1)

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