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    TEOS and TEOS/HFE plasma thin films used in electrochemical measurements 

    Type: Conference Paper
    Author : Hernandez, L.F.; da Silva, M.L.P.; Lima, R.R.; Almeida, F.L.; Santos Fo, S.G.
    Publisher: IEEE
    Year: 2014

    A Routing Framework in Software Defined Network Environment 

    Type: Conference Paper
    Author : Lin, Zhaowen; Zhang, Can; Ma, Yan; Li, Jian
    Publisher: IEEE
    Year: 2014

    Expected capacity based handoff scheme for multimedia data in WLAN 

    Type: Conference Paper
    Author : Dong-Hyun Kim , Seung-Kyu Byun , Jong-Deok Kim
    Publisher: IEEE
    Year: 2014

    The Risk Evaluation of the Engineering Change Based on the Set Pair Analysis Technology 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Robust Target Identification Using a Modified Generalized Likelihood Ratio Test 

    Type: Journal Paper
    Author : Wei Cher Chen; Shuley, Nicholas V. Z.
    Publisher: IEEE
    Year: 2014

    Radar Imaging of Impenetrable and Penetrable Targets From Finite-Duration Pulsed Signatures 

    Type: Journal Paper
    Author : Stumpf, Martin
    Publisher: IEEE
    Year: 2014

    Bayesian sparse estimation of migrating targets for wideband radar 

    Type: Journal Paper
    Author : Bidon, Stephanie; Tourneret, Jean-Yves; Savy, Laurent; Le Chevalier, F.
    Publisher: IEEE
    Year: 2014

    Design of a Kinect Sensor Based Posture Recognition System 

    Type: Conference Paper
    Author : Chang, Chia Wen; Nian, Min Da; Chen, Yi Fang; Chi, Ching Ho; Tao, Chin Wang
    Publisher: IEEE
    Year: 2014

    Automatic extraction of formal features from Word, Excel, and PowerPoint productions in a diagnostic-assessment perspective 

    Type: Conference Paper
    Author : Pellet, J.-P.; Chevalier, M.
    Publisher: IEEE
    Year: 2014

    Soiling and value of cleaning for low-tilt PV systems in temperate climates: A Swiss case study 

    Type: Conference Paper
    Author : Alet, P.-J.; Cuony, P.; Dutoit, J.; Scharrenberger, L.; Currat, B.; Perret-Aebi, L.-E.; Ballif, C.
    Publisher: IEEE
    Year: 2014
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