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E<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals

Type: Conference Paper

Author : Raghuram, M. , Sivani, K. , Reddy, K.A.

Publisher: IEEE

Year: 2014

At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs

Type: Journal Paper

Author : Kakoee, Mohammad; Bertacco, Valeria; Benini, Luca

Publisher: IEEE

Year: 2014

Author

Benini, Luca (1)

Bertacco, Valeria (1)

Kakoee, Mohammad (1)

Raghuram, M. , Sivani, K. , Reddy, K.A. (1)

Publisher

IEEE (2)

Year

2014 (2)

Keywords

fault diagnosis (2)

stuck-at fault coverage (2)

arbiter (1)

at-speed distributed functional testing (1)

circuit switching (1)

control path (1)

critical control (1)

data paths (1)

decode unit (1)

decode units (1)

Type

Conference Paper (1)

Journal Paper (1)

Language (ISO)

English (2)

Content Type

Metadata Only (2)

Publication Title

Computers, IEEE Transactions on (1)

lectronics and Communication Systems (ICECS), 2014 International Conference on (1)

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