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An Analytical Delay Model for Mechanical Stress Induced Systematic Variability Analysis in Nanoscale Circuit Design

Type: Journal Paper

Author : Alam, Naushad; Anand, B.; Dasgupta, S.

Publisher: IEEE

Year: 2014

A Patterning-Based Strain Engineering for Sub-22 nm Node FinFETs

Type: Journal Paper

Author : Schmidt, Martin; Suess, M.J.; Barros, A.D.; Geiger, Richard; Sigg, Hans; Spolenak, R.; Minamisawa, R.A.

Publisher: IEEE

Year: 2014

Implementation of E-Learning Package for Mensuration-A Branch of Mathematics

Type: Conference Paper

Author : Prabha, S.L. , Shanavas, A.R.M.

Publisher: IEEE

Year: 2014

A Steganographic Method for Binary Embedding Using Time-Varying Convolutional Codes

Type: Conference Paper

Author : Chi-Yuan Lin , Kai-Ren Chen , Jyun-Jie Wang

Publisher: IEEE

Year: 2014

Harnessing bursty interference in multicarrier systems with feedback

Type: Conference Paper

Author : Mishra, S. , I-Hsiang Wang , Diggavi, S.

Publisher: IEEE

Year: 2014

A current-tripler-rectifier PWM ZVS three-phase full-bridge DC/DC converter with Y-Δ connected transformer

Type: Conference Paper

Publisher: IEEE

Year: 2014

Positive definite kernel functions on fuzzy sets

Type: Conference Paper

Author : Guevara, J. , Hirata, R. , Canu, S.

Publisher: IEEE

Year: 2014

Experimental Study on NBTI Degradation Behaviors in Si pMOSFETs Under Compressive and Tensile Strains

Type: Journal Paper

Author : Wangran Wu; Chang Liu; Jiabao Sun; Wenjie Yu; Xi Wang; Yi Shi; Yi Zhao

Publisher: IEEE

Year: 2014

GeTe Liner Stressor Featuring Phase-Change- Induced Volume Contraction for Strain Engineering of Sub-50-nm p-Channel FinFETs: Simulation and Electrical Characterization

Type: Journal Paper

Author : Ran Cheng; Yinjie Ding; Shao-Ming Koh; Yue Yang; Fan Bai; Bin Liu; Yee-Chia Yeo

Publisher: IEEE

Year: 2014

Sistema de descarte de cargas e sincronização automática com base na norma IEC 61850-implantação e testes

Type: Conference Paper

Author : Ferreira, Adriel Angelo; Abboud, Ricardo; Franco, Paulo; Cardoso, Rafael

Publisher: IEEE

Year: 2014

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An Analytical Delay Model for Mechanical Stress Induced Systematic Variability Analysis in Nanoscale Circuit Design

A Patterning-Based Strain Engineering for Sub-22 nm Node FinFETs

Implementation of E-Learning Package for Mensuration-A Branch of Mathematics

A Steganographic Method for Binary Embedding Using Time-Varying Convolutional Codes

Harnessing bursty interference in multicarrier systems with feedback

A current-tripler-rectifier PWM ZVS three-phase full-bridge DC/DC converter with Y-Δ connected transformer

Positive definite kernel functions on fuzzy sets

Experimental Study on NBTI Degradation Behaviors in Si pMOSFETs Under Compressive and Tensile Strains

GeTe Liner Stressor Featuring Phase-Change- Induced Volume Contraction for Strain Engineering of Sub-50-nm p-Channel FinFETs: Simulation and Electrical Characterization

Sistema de descarte de cargas e sincronização automática com base na norma IEC 61850-implantação e testes

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An Analytical Delay Model for Mechanical Stress Induced Systematic Variability Analysis in Nanoscale Circuit Design

A Patterning-Based Strain Engineering for Sub-22 nm Node FinFETs

Implementation of E-Learning Package for Mensuration-A Branch of Mathematics

A Steganographic Method for Binary Embedding Using Time-Varying Convolutional Codes

Harnessing bursty interference in multicarrier systems with feedback

A current-tripler-rectifier PWM ZVS three-phase full-bridge DC/DC converter with Y-&#x0394; connected transformer

Positive definite kernel functions on fuzzy sets

Experimental Study on NBTI Degradation Behaviors in Si pMOSFETs Under Compressive and Tensile Strains

GeTe Liner Stressor Featuring Phase-Change- Induced Volume Contraction for Strain Engineering of Sub-50-nm p-Channel FinFETs: Simulation and Electrical Characterization

Sistema de descarte de cargas e sincroniza&#x00E7;&#x00E3;o autom&#x00E1;tica com base na norma IEC 61850-implanta&#x00E7;&#x00E3;o e testes

A current-tripler-rectifier PWM ZVS three-phase full-bridge DC/DC converter with Y-Δ connected transformer

Sistema de descarte de cargas e sincronização automática com base na norma IEC 61850-implantação e testes