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Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area

Type: Journal Paper

Author : Shuming Chen; Yankang Du; Biwei Liu; Junrui Qin

Publisher: IEEE

Year: 2014

A Constrained Layout Placement Approach to Enhance Pulse Quenching Effect in Large Combinational Circuits

Type: Journal Paper

Author : Yankang Du; Shuming Chen; Biwei Liu

Publisher: IEEE

Year: 2014

Unveiling nonlinear dynamics in resonant inductively coupled wireless power transfer

Type: Conference Paper

Publisher: IEEE

Year: 2014

Ship motions of small trawler with advanced speed in wash wave reproduced by wave generator

Type: Conference Paper

Author : Kuroda, Takako; Kobayashi, Hiroshi; Houtani, Hidetaka; Tanizawa, Katsuji

Publisher: IEEE

Year: 2014

Author

Biwei Liu (2)

Shuming Chen (2)

Yankang Du (2)

Houtani, Hidetaka (1)

Junrui Qin (1)

Kobayashi, Hiroshi (1)

Kuroda, Takako (1)

Tanizawa, Katsuji (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

radiation hardening (electronics) (3)

Combinational circuits (2)

combinational circuits (2)

Ions (2)

Layout (2)

Logic gates (2)

MOSFET (2)

soft error vulnerability (2)

cache coherence protocols (1)

cache storage (1)

Type

Conference Paper (2)

Journal Paper (2)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

ceans - St. John&#039;s, 2014 (1)

Device and Materials Reliability, IEEE Transactions on (1)

ircuits and Systems (ISCAS), 2014 IEEE International Symposium on (1)

Nuclear Science, IEEE Transactions on (1)

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