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Securing communication in cyber-physical systems using steganography and cryptography

Type: Conference Paper

Author : Vegh, L. , Miclea, L.

Publisher: IEEE

Year: 2014

Long-Term Destructive SEE Risk and Calculations Using Multiple “Worst-Case” Events Versus Modelling

Type: Journal Paper

Author : Jiggens, Piers; Evans, Hugh; Truscott, Pete; Heynderickx, Daniel; Fan Lei; DeDonder, Erwin

Publisher: IEEE

Year: 2014

Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips

Type: Journal Paper

Author : Chia-Hsiang Chen; Knag, Phil; Zhengya Zhang

Publisher: IEEE

Year: 2014

Determination of Single-Event Effect Application Requirements for Enhancement Mode Gallium Nitride HEMTs for Use in Power Distribution Circuits

Type: Journal Paper

Author : Scheick, Leif

Publisher: IEEE

Year: 2014

Single Event Effects in Carbon Nanotube-Based Field Effect Transistors Under Energetic Particle Radiation

Type: Journal Paper

Author : Bushmaker, Adam W.; Walker, David; Mann, Colin J.; Oklejas, Vanessa; Hopkins, Alan R.; Amer, Moh R.; Cronin, Stephen B.

Publisher: IEEE

Year: 2014

A Two-Order Increase in Robustness of Partial Redundancy Under a Radiation Stress Test by Using SDC Prediction

Type: Journal Paper

Author : Ahmed, Toufik; Jun Yao; Nakashima, Yuta

Publisher: IEEE

Year: 2014

A Dosimetry Methodology for Two-Photon Absorption Induced Single-Event Effects Measurements

Type: Journal Paper

Author : Khachatrian, Ani; Roche, Nicholas J.-H; McMorrow, Dale; Warner, Jeffrey H.; Buchner, Stephen P.; Melinger, Joseph S.

Publisher: IEEE

Year: 2014

Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

Type: Journal Paper

Author : Hales, Joel M.; McMorrow, Dale; Roche, Nicholas J.-H; Khachatrian, Ani; Warner, Jeffrey H.; Buchner, Stephen P.; Melinger, Joseph S.; Perry, Joseph W.; Lotshaw, William T.; Dubikovsky, Vladislav

Publisher: IEEE

Year: 2014

Simulation study of single event effects for split-gate enhanced power U-shape metal-oxide semiconductor field-effect transistor

Type: Journal Paper

Author : Wang Ying; Cheng-Hao Yu; Fei Cao; Ming-Guang Shan

Publisher: IET

Year: 2014

Voltage regulation of LV feeders with high penetration of PV distributed generation using electronic tap changing transformers

Type: Conference Paper

Author : Kabiri, Roozbeh; Holmes, Donald Grahame; McGrath, Brendan P.

Publisher: IEEE

Year: 2014

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Securing communication in cyber-physical systems using steganography and cryptography

Long-Term Destructive SEE Risk and Calculations Using Multiple “Worst-Case” Events Versus Modelling

Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips

Determination of Single-Event Effect Application Requirements for Enhancement Mode Gallium Nitride HEMTs for Use in Power Distribution Circuits

Single Event Effects in Carbon Nanotube-Based Field Effect Transistors Under Energetic Particle Radiation

A Two-Order Increase in Robustness of Partial Redundancy Under a Radiation Stress Test by Using SDC Prediction

A Dosimetry Methodology for Two-Photon Absorption Induced Single-Event Effects Measurements

Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

Simulation study of single event effects for split-gate enhanced power U-shape metal-oxide semiconductor field-effect transistor

Voltage regulation of LV feeders with high penetration of PV distributed generation using electronic tap changing transformers

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Securing communication in cyber-physical systems using steganography and cryptography

Long-Term Destructive SEE Risk and Calculations Using Multiple &#x201C;Worst-Case&#x201D; Events Versus Modelling

Characterization of Heavy-Ion-Induced Single-Event Effects in 65&#x00A0;nm Bulk CMOS ASIC Test Chips

Determination of Single-Event Effect Application Requirements for Enhancement Mode Gallium Nitride HEMTs for Use in Power Distribution Circuits

Single Event Effects in Carbon Nanotube-Based Field Effect Transistors Under Energetic Particle Radiation

A Two-Order Increase in Robustness of Partial Redundancy Under a Radiation Stress Test by Using SDC Prediction

A Dosimetry Methodology for Two-Photon Absorption Induced Single-Event Effects Measurements

Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

Simulation study of single event effects for split-gate enhanced power U-shape metal-oxide semiconductor field-effect transistor

Voltage regulation of LV feeders with high penetration of PV distributed generation using electronic tap changing transformers

Long-Term Destructive SEE Risk and Calculations Using Multiple “Worst-Case” Events Versus Modelling

Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips