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A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Type: Journal Paper

Author : Wenjie Lu; Guo, Anjin; Vardi, Alon; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

Single-phase electric drive for automotive applications

Type: Conference Paper

Author : Vodovozov, V. , Lillo, N. , Raud, Z.

Publisher: IEEE

Year: 2014

Excellent epitaxial graphene layers grown simply on SiC substrates and their characterisation

Type: Journal Paper

Author : Jeong, Sangkwon; Lee, Edward; Yim, Mark; Yoon, Giwan

Publisher: IET

Year: 2014

Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon

Type: Journal Paper

Author : Muller, Johannes; Hannebauer, Helge; Mader, Christoph; Haase, Frerk; Bothe, Klaus

Publisher: IEEE

Year: 2014

Aluminum-Based Rear-Side PVD Metallization for nPERT Silicon Solar Cells

Type: Journal Paper

Author : Katkhouda, Kamal; Martinez-Limia, Alberto; Bornschein, Lutz; Koseva, Radinka; Geppert, Torsten; Grohe, Andreas; Krokoszinski, Hans-Joachim; Schaaf, P.

Publisher: IEEE

Year: 2014

OpenPLC: An open source alternative to automation

Type: Conference Paper

Author : Alves, Thiago Rodrigues; Buratto, Mario; de Souza, Flavio Mauricio; Rodrigues, Thelma Virginia

Publisher: IEEE

Year: 2014

RC-Constant in Organic Photodiodes Comprising Electrodes With a Significant Sheet Resistance

Type: Journal Paper

Author : Mescher, Jan; Kettlitz, Siegfried W.; Egel, Amos; Moosmann, Carola; Christ, Nico S.; Valouch, Sebastian; Lemmer, Uli

Publisher: IEEE

Year: 2014

Piezoresistive Effect of p-Type Single Crystalline 3C-SiC Thin Film

Type: Journal Paper

Author : Hoang-Phuong Phan; Tanner, Philip; Dzung Viet Dao; Li Wang; Nam-Trung Nguyen; Yong Zhu; Dimitrijev, Sima

Publisher: IEEE

Year: 2014

A low supply voltage 2µW half bandgap reference in standard sub-µ CMOS

Type: Conference Paper

Author : Far, A.

Year: 2014

Process-Variation Aware Multi-temperature Test Scheduling

Type: Conference Paper

Author : Aghaee, N. , Peng, Z. , Eles, P.

Year: 2014

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A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Single-phase electric drive for automotive applications

Excellent epitaxial graphene layers grown simply on SiC substrates and their characterisation

Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon

Aluminum-Based Rear-Side PVD Metallization for nPERT Silicon Solar Cells

OpenPLC: An open source alternative to automation

RC-Constant in Organic Photodiodes Comprising Electrodes With a Significant Sheet Resistance

Piezoresistive Effect of p-Type Single Crystalline 3C-SiC Thin Film

A low supply voltage 2µW half bandgap reference in standard sub-µ CMOS

Process-Variation Aware Multi-temperature Test Scheduling

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A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Single-phase electric drive for automotive applications

Excellent epitaxial graphene layers grown simply on SiC substrates and their characterisation

Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon

Aluminum-Based Rear-Side PVD Metallization for nPERT Silicon Solar Cells

OpenPLC: An open source alternative to automation

RC-Constant in Organic Photodiodes Comprising Electrodes With a Significant Sheet Resistance

Piezoresistive Effect of p-Type Single Crystalline 3C-SiC Thin Film

A low supply voltage 2&#x00B5;W half bandgap reference in standard sub-&#x00B5; CMOS

Process-Variation Aware Multi-temperature Test Scheduling

A low supply voltage 2µW half bandgap reference in standard sub-µ CMOS