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Now showing items 1-6 of 6
A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories
Publisher: IEEE
Year: 2014
A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs
Publisher: IEEE
Year: 2014
Bubble shape estimation in gas-liquid slug flow using wire-mesh sensor and advanced data processing
Publisher: IEEE
Year: 2014
Ultrasound interactive segmentation with tensor-graph methods
Publisher: IEEE
Year: 2014
Efficient Variation-Aware Delay Fault Simulation Methodology for Resistive Open and Bridge Defects
Publisher: IEEE
Year: 2014



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