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Some Results Based on Entropy Properties of Progressive Type-II Censored Data

Type: Journal Paper

Author : جعفر احمدی; Jafar Ahmadi

Year: 2008

Abstract:

In many life-testing and reliability studies, the experimenter might

not always obtain complete information on failure times for all experimental units. One of the most common censoring schemes is progressive ...

Reliability Properties of <formula formulatype="inline"> <img src="/images/tex/21379.gif" alt="(n,f,k)"> </formula> Systems

Type: Journal Paper

Author : Triantafyllou, Ioannis S.; Koutras, Markos V.

Publisher: IEEE

Year: 2014

Noise in physical systems: What to do about it?

Type: Conference Paper

Author : Gammaitoni, L.

Publisher: IEEE

Year: 2014

Equipment Isolation Systems by Means of Semi Active Control Devices

Type: Conference Paper

Author : Basili, M.; De Angelis, M.

Publisher: IEEE

Year: 2014

Feature Selection and Term Weighting

Type: Conference Paper

Author : Algarni, A.; Tairan, N.

Publisher: IEEE

Year: 2014

Differential Evolution based trajectory optimization of a four stage Launch Vehicle

Type: Conference Paper

Author : Ghosh, A.; Chattopadhyay, S.

Publisher: IEEE

Year: 2014

Improved reliability properties of (Pb,La) (Zr,Ti)O<sub>3</sub> ferroelectric capacitors by thin aluminium-doped zinc oxide buffer layer

Type: Journal Paper

Author : Takada, Yasuhiro; Tsuji, Takao; Okamoto, N.; Saito, Takashi; Kondo, K.; Yoshimura, Tetsuzo; Fujimura, Naoki; Higuchi, Kenichi; Kitajima, A.

Publisher: IET

Year: 2014

Mechanism of High Temperature Retention Property (up to 200 °C) in ZrO<sub>2</sub>-Based Memory Device With Inserting a ZnO Thin Layer

Type: Journal Paper

Author : Chand, Umesh; Chun-Yang Huang; Tseung-Yuen Tseng

Publisher: IEEE

Year: 2014

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Some Results Based on Entropy Properties of Progressive Type-II Censored Data

Reliability Properties of <formula formulatype="inline"> <img src="/images/tex/21379.gif" alt="(n,f,k)"> </formula> Systems

Noise in physical systems: What to do about it?

Equipment Isolation Systems by Means of Semi Active Control Devices

Feature Selection and Term Weighting

Differential Evolution based trajectory optimization of a four stage Launch Vehicle

Improved reliability properties of (Pb,La) (Zr,Ti)O<sub>3</sub> ferroelectric capacitors by thin aluminium-doped zinc oxide buffer layer

Mechanism of High Temperature Retention Property (up to 200 °C) in ZrO<sub>2</sub>-Based Memory Device With Inserting a ZnO Thin Layer

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Some Results Based on Entropy Properties of Progressive Type-II Censored Data

Reliability Properties of <formula formulatype="inline"> <img src="/images/tex/21379.gif" alt="(n,f,k)"> </formula> Systems

Noise in physical systems: What to do about it?

Equipment Isolation Systems by Means of Semi Active Control Devices

Feature Selection and Term Weighting

Differential Evolution based trajectory optimization of a four stage Launch Vehicle

Improved reliability properties of (Pb,La) (Zr,Ti)O<sub>3</sub> ferroelectric capacitors by thin aluminium-doped zinc oxide buffer layer

Mechanism of High Temperature Retention Property (up to 200 &#x00B0;C) in ZrO<sub>2</sub>-Based Memory Device With Inserting a ZnO Thin Layer

Mechanism of High Temperature Retention Property (up to 200 °C) in ZrO<sub>2</sub>-Based Memory Device With Inserting a ZnO Thin Layer