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DECO: DIMM controller efficient for ECC operations

Type: Journal Paper

Author : Wooyoung Jang

Publisher: IET

Year: 2014

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Type: Journal Paper

Author : Azevedo, Joao; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, Aida; Alvarez-Herault, Jeremy; Mackay, Ken

Publisher: IEEE

Year: 2014

Performance optimization of PVM based parallel applications using optimal number of slaves

Type: Conference Paper

Publisher: IEEE

Year: 2014

Error-Correcting Code Aware Memory Subsystem

Type: Journal Paper

Author : Wooyoung Jang

Publisher: IEEE

Year: 2014

Column selection solutions for L1 data caches implemented using eight-transistor cells

Type: Journal Paper

Author : Farahani, Mostafa; Baniasadi, Amirali

Publisher: IET

Year: 2014

<inline-formula> <img src="/images/tex/21634.gif" alt="mathsf{B}^{p}"> </inline-formula>-<inline-formula> <img src="/images/tex/21635.gif" alt="mathsf{Tree}"> </inline-formula>: A Predictive <inline-formula> <img src="/images/tex/21636.gif" alt="mathsf{B}^{+}"> </inline-formula>-<inline-formula> <img src="/images/tex/21635.gif" alt="mathsf{Tree}"> <

Type: Journal Paper

Author : Weiwei Hu; Guoliang Li; Jiacai Ni; Dalie Sun; Kian-Lee Tan

Publisher: IEEE

Year: 2014

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DECO: DIMM controller efficient for ECC operations

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Performance optimization of PVM based parallel applications using optimal number of slaves

Error-Correcting Code Aware Memory Subsystem

Column selection solutions for L1 data caches implemented using eight-transistor cells

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DECO: DIMM controller efficient for ECC operations

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Performance optimization of PVM based parallel applications using optimal number of slaves

Error-Correcting Code Aware Memory Subsystem

Column selection solutions for L1 data caches implemented using eight-transistor cells