Search

English
- Persian
- English
Login

Ferdowsi University of Mashhad
|
Information Center and Central Library

- Persian
- English

Home
Source Types
- Journal Paper
- Ebook
- Conference Paper
- Standard
- Protocol
- Thesis
Use Help

FUM Digital Library
Search

FUM Digital Library
Search

All Fields
Title
Author
Year
Publisher
Subject
Publication Title
ISSN
DOI
ISBN

Advanced Search

JavaScript is disabled for your browser. Some features of this site may not work without it.

Search

Show Advanced Filters Hide Advanced Filters

Filters

Use filters to refine the search results.

Now showing items 1-5 of 5

Relevance
Title Asc
Title Desc
Year Asc
Year Desc

5
10
20
40
60
80
100

CSV
RIS

Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100

PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic

Type: Journal Paper

Author : Jiwu Lu; Jiao, Guangfan; Vaz, C.; Campbell, J.P.; Ryan, J.T.; Cheung, K.P.; Bersuker, Gennadi; Young, Cliff

Publisher: IEEE

Year: 2014

On-Chip Codeword Generation to Cope With Crosstalk

Type: Journal Paper

Author : Karmarkar, Kedar; Tragoudas, Spyros

Publisher: IEEE

Year: 2014

A Disciplinary Framework to Study User Acceptance of Innovative Technologies

Type: Conference Paper

Author : Hee Cheol Kim

Publisher: IEEE

Year: 2014

Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter

Type: Journal Paper

Author : Jiao, G.F.; Lu, J.W.; Campbell, J.P.; Ryan, J.T.; Cheung, K.P.; Young, Chadwin D.; Bersuker, Gennadi

Publisher: IEEE

Year: 2014

JPrivacy: A java privacy profiling framework for Big Data applications

Type: Conference Paper

Author : Abdellatif, M.; Saleh, I.; Blake, M.B.

Publisher: IEEE

Year: 2014

Author

Bersuker, Gennadi (2)

Campbell, J.P. (2)

Cheung, K.P. (2)

Ryan, J.T. (2)

Abdellatif, M. (1)

Blake, M.B. (1)

Hee Cheol Kim (1)

Jiao, G.F. (1)

Jiao, Guangfan (1)

Jiwu Lu (1)

Publisher

IEEE (5)

Year

2014 (5)

Keywords

Stress (3)

bias temperature instability (2)

Current measurement (2)

logic circuits (2)

Logic gates (2)

Stress measurement (2)

Timing (2)

timing circuits (2)

adders (1)

area overhead (1)

Type

Journal Paper (3)

Conference Paper (2)

Language (ISO)

English (5)

Content Type

Metadata Only (5)

Publication Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on (1)

Device and Materials Reliability, IEEE Transactions on (1)

Electron Devices, IEEE Transactions on (1)

ollaborative Computing: Networking, Applications and Worksharing (CollaborateCom), 2014 Internationa (1)

omputer, Consumer and Control (IS3C), 2014 International Symposium on (1)

About Us

نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش

DSpace software copyright © 2019-2022 DuraSpace