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BSIM6: Analog and RF Compact Model for Bulk MOSFET

Type: Journal Paper

Author : Chauhan, Yogesh Singh; Venugopalan, Sarad; Chalkiadaki, Maria-Anna; Karim, Muhammed Ahosan Ul; Agarwal, Harshit; Khandelwal, Sourabh; Paydavosi, Navid; Duarte, Juan Pablo; Enz, C.C.; Niknejad, Ali M.; Chenming Hu

Publisher: IEEE

Year: 2014

A bug Mining tool to identify and analyze security bugs using Naive Bayes and TF-IDF

Type: Conference Paper

Author : Behl, D. , Handa, S. , Arora, A.

Publisher: IEEE

Year: 2014

[Front cover]

Type: Conference Paper

Publisher: IEEE

Year: 2014

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BSIM6: Analog and RF Compact Model for Bulk MOSFET

A bug Mining tool to identify and analyze security bugs using Naive Bayes and TF-IDF

[Front cover]

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BSIM6: Analog and RF Compact Model for Bulk MOSFET

A bug Mining tool to identify and analyze security bugs using Naive Bayes and TF-IDF

[Front cover]