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Benchmarking Transition Metal Dichalcogenide MOSFET in the Ultimate Physical Scaling Limit

Type: Journal Paper

Author : Majumdar, K.; Hobbs, Chris; Kirsch, P.D.

Publisher: IEEE

Year: 2014

Privacy as a Tradeoff: Introducing the Notion of Privacy Calculus for Context-Aware Mobile Applications

Type: Conference Paper

Author : Zhan Liu , Jialu Shan , Bonazzi, R. , Pigneur, Y.

Publisher: IEEE

Year: 2014

Author

Hobbs, Chris (1)

Kirsch, P.D. (1)

Majumdar, K. (1)

Zhan Liu , Jialu Shan , Bonazzi, R. , Pigneur, Y. (1)

Publisher

IEEE (2)

Year

2014 (2)

Keywords

physical gate length (2)

2D material (1)

analogue transistors (1)

ballistic performance (1)

Benchmark testing (1)

carrier density (1)

device OFF current (1)

device threshold voltage (1)

direct source-drain tunneling (1)

doping concentration (1)

Type

Conference Paper (1)

Journal Paper (1)

Language (ISO)

English (2)

Content Type

Metadata Only (2)

Publication Title

Electron Device Letters, IEEE (1)

ystem Sciences (HICSS), 2014 47th Hawaii International Conference on (1)

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