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    Estimates for the overshoot of a random walk with negative drift and non convolution equivalent increments 

    Type: Journal Paper
    Author : Wang, Kaiyong - Yang, Yang - Yu, Changjun
    Publisher: Elsevier Science
    Year: 2013

    Three-Valley Model For The Study Of Electron Transport Properties At Very High Electric Field In Bulk GaSb, Ga0.5Sb0.5As and GaAs Materials 

    Type: Journal Paper
    Author : هادی عربشاهی; Hadi Arabshahi
    Year: 2011
    Abstract:

    considered have been taken into

    account. For all materials, it is found that electron velocity

    overshoot only occurs when the electric field is increased to a

    value above a certain critical filed, unique to each material. This...

    Study of High Field Electron Transport in AlN and AlGaN Semiconductors Using Monte Carlo Simulation 

    Type: Journal Paper
    Author : S. Ranjvar; هادی عربشاهی; M. R. Benam; Hadi Arabshahi
    Year: 2011
    Abstract:

    An ensemble Monte Carlo simulation is used

    to compare high field electron transport in bulk AlN and

    AlGaN. For all materials, we find that electron velocity

    overshoot only occurs when the electric field in increased to...

    Comparison of High Field Electron Transport in Wurtzite Phase of GaN and AlGaN 

    Type: Journal Paper
    Author : Forogh-e-Sadat Tabasi; هادی عربشاهی; Hadi Arabshahi
    Year: 2011
    Abstract:

    overshoot in two semiconductors....

    Overshoot in biological systems modelled by Markov chains: a non-equilibrium dynamic phenomenon 

    Type: Journal Paper
    Author : Chen Jia; Minping Qian; Daquan Jiang
    Publisher: IET
    Year: 2014

    Monte Carlo Modeling of Hot Electron Transport in Bulk AlAs, AlGaAs and GaAs at Room Temperature 

    Type: Journal Paper
    Author : هادی عربشاهی; M. R. Khalvati; محمود رضائی رکن آبادی; Hadi Arabshahi; Mahmood Rezaee Roknabadi
    Year: 2008
    Abstract:

    The results of an ensemble Monte Carlo simulation of electron drif velocity response on the application field in bulk AlAs, AlGaAs AND GaAs are presented.

    Comparison of Transient Ballistic Electron Transport in Bulk Wurtzite Phase 6H-SiC and GaN 

    Type: Journal Paper
    Author : هادی عربشاهی; Hadi Arabshahi
    Year: 2008
    Abstract:

    An ensemble Monte Carlo simulation is used to compare bulk electron ballistic transport

    in 6H-SiC and GaN materials. Electronic states within the conduction band valleys at

    Transient and Steady-state Electron Transport Properties in Bulk Doped Ternary Nitride Materials Using an Ensemble Monte Carlo Method 

    Type: Journal Paper
    Author : هادی عربشاهی; Hadi Arabshahi
    Year: 2011
    Abstract:

    >
    ellipsoidal shaps centered on important symmetry points of the Brillouin zone. For all materials, it is found that electron

    velocity overshoot only occurs when the electric field is increased to a value above a certain critical field, unique to each ...

    Calculated electron steady-state drift velocity in lattice matched Ga0.5In0.5P and Al0.26Ga0.26In0.48P using a threevalley Monte Carlo simulation 

    Type: Journal Paper
    Author : S. Gholafroz; هادی عربشاهی; Hadi Arabshahi
    Year: 2010
    Abstract:



    transport physics are examined. For two materials, it is found that electron velocity overshoot only

    occurs when the electric field is increased to a value above a certain critical field, unique to each

    material. This critical field is strongly...

    Steady-state and Transient Electron Transport Within Bulk III-V Nitride Semiconductors Using an Updated Semiclassical Three-valley Monte Carlo Method 

    Type: Journal Paper
    Author : هادی عربشاهی; محمود رضائی رکن آبادی; فاطمه بدیعیان باغ سیاهی; zahra eslami; Hadi Arabshahi; Mahmood Rezaee Roknabadi; fatemeh badieian baghsiyahi
    Year: 2010
    Abstract:

    An ensemble Monte Carlo simulation is used to compare high field electron transport in

    bulk InN, AlN and GaN. For all materials, we find that electron velocity overshoot only

    occurs when the electric field in increased to a value above...

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