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A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Type: Journal Paper

Author : Azevedo, Joao; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, Aida; Alvarez-Herault, Jeremy; Mackay, Ken

Publisher: IEEE

Year: 2014

Optimization and Evaluation of Variability in the Programming Window of a Flash Cell With Molecular Metal–Oxide Storage

Type: Journal Paper

Author : Georgiev, Vihar P.; Markov, Stanislav; Vila-Nadal, Laia; Busche, Christoph; Cronin, Leroy; Asenov, Asen

Publisher: IEEE

Year: 2014

Adaptive Threshold Read Algorithms in Multi-Level Non-Volatile Memories

Type: Journal Paper

Author : Hemo, Evyatar; Cassuto, Yuval

Publisher: IEEE

Year: 2014

Comprehensive Study of N-Channel and P-Channel Twin Poly-Si FinFET Nonvolatile Memory

Type: Journal Paper

Author : Mu-Shih Yeh; Yung-Chun Wu; Kuan-Cheng Liu; Min-Feng Hung; Yi-Ruei Jhan; Nan-Heng Lu; Ming-Hsien Chung; Min-Hsin Wu

Publisher: IEEE

Year: 2014

Author

Alvarez-Herault, Jeremy (1)

Asenov, Asen (1)

Azevedo, Joao (1)

Bosio, A. (1)

Busche, Christoph (1)

Cassuto, Yuval (1)

Cronin, Leroy (1)

Dilillo, L. (1)

Georgiev, Vihar P. (1)

Girard, P. (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

Nonvolatile memory (3)

random-access storage (3)

flash memories (2)

Logic gates (2)

MOSFET (2)

nonvolatile memory (NVM) (2)

3-D (1)

3D stacked flash memory (1)

??-gate (1)

active matrix liquid crystal display (1)

Type

Journal Paper (4)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

Electron Devices, IEEE Transactions on (1)

Nanotechnology, IEEE Transactions on (1)

Selected Areas in Communications, IEEE Journal on (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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